Microscope upgrade

Jon Lawson

Vision Engineering is launching the next generation of its EVO Cam digital microscope.

Ideally suited for close inspection and recording of high resolution images the next-generation EVO Cam II benefits from the addition of user customisable overlays, on-board measurement and wi-fi image transfer. All supported by a 30:1 optical zoom and a maximum magnification in excess of 3,600x.

EVO Cam II replaces the original EVO Cam which is used for inspection of electronics, automotive and aerospace components, medical devices, precision engineering, plastic moulding and more.

High definition images can be captured and stored directly to a USB memory stick. When connected to a PC, images and video can be easily captured, stored and shared. A wi-fi dongle even allows direct sharing with PCs, laptops, tablet computers and smartphones.

Simple on-screen measurement can be performed with the aid of virtual callipers and scalable grids. Live images can also be compared to user customisable overlays, increasing efficiency of use.

A completely new graphical user interface and intuitive controls with 10 pre-sets, allow for rapid swapping out of subjects under inspection, making EVO Cam II ideal for multiple users in high speed production environments. A remote control option is available to maximise the ergonomic operation of the microscope when used over prolonged periods.

EVO Cam II features a powerful LED ring light and sub-stage lighting for viewing translucent samples. A UV ring light accessory is also available for electronic and other specific applications. High contrast subjects, such as reflective metals used in electronics and automotive manufacturing, can be viewed in more detail using EVO Cam II’s Wide Dynamic Range (WDR) mode.

For additional clarity, EVO Cam II is launched along with a new range of objective lenses to deliver pin sharp images, high in detail and contrast. Vision Engineering’s unique 360° rotating viewer is ideal for hard to handle subjects, allowing inspection of the sides and base of samples.

 

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