Reverberation chambers: the modern EMC test environment

Models RVC XS and 2XS provide high performance in a portable, compact RF test chamber

Test tweezers ease electronics diagnosis

Quick-Test Tweezers simplify quality assurance inspections of incoming circuit boards or loose components, as well as troubleshooting

Dual encoder to USB converter allows PC access to encoder data

Suitable for system setup and debugging, data acquisition, analysis, monitoring and PC based control applications, says BEI Industrial Encoders

Test system for conducted and radiated immunity

Teseq NSG 4070 offers test frequency range, from 9kHz to 1GHz and its modular set-up, make it suitable for a wide variety of test applications

LVDTs suit applications requiring high-frequency response

RDP Electronics says that its LVDTs are able to respond to mechanical oscillations at up to 1kHz and have a lifetime that is effectively infinite

Universal data acquisition system with new analogue output interface

MX878 module for the QuantumX system provides a total of eight analogue voltage outputs and local intelligence

Handheld tester designed for use with Industrial Ethernet

Ideal Industries is launching the IENet Pro Industrial Ethernet Cable Tester that has been optimised for efficient testing of local area networks using Industrial Ethernet

Collect on-machine data for power, torque and speed

New kits from Datum Electronics enable engineers to collect power, torque and speed data from equipment during trials on when in use

Labview 2010 gains new user-requested features

National Instruments says that its latest version of Labview features many features requested by customers, plus an enhanced compiler enables code to run faster

Data acquisition system handles 28 channels at high sampling rate

Kistler's new Type 5697A… data acquisition system is suitable for acquiring and evaluating data from up to 28 channels at a high sampling rate

Angular encoder operates in harsh environments

Zettlex's Incoder angular encoder is characterised by a flat, open construction and the ability to survive in harsh environments

Unit testing incorporating hardware

The hardware under test either can be the on-chip peripherals of a microcontroller or hardware external to the microcontroller

Static testing to fatigue

Nordson DAGE announces new materials test capability

Growth in mobile backhaul spurs demand for gigabit Ethernet test equipment

High R and D investments, proving ROI and product pricing emerge as key industry challenges

Wireless NVH test solutions to offset growing clout of secondhand test equipment market

Environmental noise applications poised to drive the market over the next five years



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