High performance oscilloscope

Teledyne LeCroy oscilloscopes come in either 350MHz or 500MHz bandwidth

The cathodoluminescence revolution goes 3D

3D mapping of spectroscopic features on nanoscale objects

Modular electronic loads for power testing

Solution for testing of today’s sophisticated power supplies, batteries, LEDs, adaptors and converters

Signal analysis for automotive radar testing

Rohde & Schwarz is now combining the ARTS turnkey radar target simulator from ITS and miro-sys with its FSW high-end signal and spectrum analyser

New line of high power linear RF amplifiers

Brand new coaxial GaAs MMIC-based high power amplifiers released by Pasternack

Debug tool supports new ARM Cortex-M7 processor

µTrace is an all-in-one solution supporting both debug and trace for Cortex-M-based processors

CO2 and temperature transmitter for duct mounting

Device allows highly accurate and reliable measurements of CO2 concentrations up to 10,000 ppm

New data acquisition tool

High-speed DAQ device for test bench applications

Reliability testing for power components

Intepro SemTest system performs a combination of thermal and electrical cycles to verify new products, processes and materials

All-in-one digital multi-meters

All-in-one digital multi-meters with power supply functionality introduced to market by test and measurement equipment expert

First VPX GSM monitoring receiver

Full global system for mobile communications spectrum monitoring targets homeland security, government and military applications

Exploring peak data rates of 10Gbit/s

National Instruments teams up with Nokia for high speed 5G wireless

High-performance entry-level laser scanner introduced

Leica Geosystems has announced the launch of its latest 3D laser scanner, the ScanStation P15, which is designed to be the ideal entry into the world of 3D laser scanning

Digital predistortion option shortens test time

Predistortion can extend the operating range of amplifiers but determining the right correction factors has always been a time-consuming process

Wafer X-ray metrology platform

Precision, detection and throughput for fully automated wafer measurement of TSVs, 3D packages and wafer bumps


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