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ITCM designs and develops special-purpose machinery and production processes with core strengths in web processing, powder dosing, novel packaging and high-speed assembly automation.



 
 
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Process Engineer - Instrumentation


Hire demand for new advanced XRF metals analyser
 

Hire demand for new advanced XRF metals analyser

Many materials inspection engineers have highlighted a need for even higher levels of precision in the equipment provided by instrumentation specialist Ashtead Technology.

As a result, the company has expanded its fleet of Non Destructive Testing (NDT) rental instruments to include the new XRF Niton GOLDD XL2, which is capable of extremely high levels of performance in portable metals analysis.

XRF analysers provide fast, non-destructive, qualitative and quantitative assessment of metals and alloys in a variety of materials. However, the XL2 GOLDD can provide precise analysis up to 10 times quicker than existing analysers and can detect elements with atomic numbers as low as thirteen (including Magnesium and Aluminium), providing the user with portable, lab quality analysis in an easy to use, point-and-shoot instrument.

According to Ashtead Technology’s NDT Sales Manager Peter Myatt, the lower detection levels of the XL2 increase the range of applications for which the device can be used. He said: “This new version is ideal for use in cases where the most precise analysis is required. The XL2 provides the highest quality analysis and verification necessary for a number of applications, including the classification of aluminium within the aerospace sector where materials need to be replaced with those of the same composition, strength and weight.

“Further applications for the XL2 include quality control in manufacturing, metal evaluation in power stations and refineries and for surveyors in the analysis of old structures prior to renovation. XRF analysers are also popular in the assessment of contaminated land and the testing of materials for compliance with the RoHS Regulations and the WEEE Directive.”

Prior to the advent of XRF technology, spark-based OES (optical emission spectroscopy) instrumentation was traditionally used but this was typically larger equipment which also required complex and time-consuming sample preparation in stark contrast to the small, fast, easy-to-use and highly advanced XL2.

For more information, visit www.ashtead-technology.com/uk
 
 

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